International Etalon Forum 3. – 4. November 2016
Controlling the micron in industry and research
To celebrate our 12th anniversary, we are organizing a professional event focussing on “Controlling the micron in industry and research” in cooperation with our customers and partners. The event targets technical experts and decision makers from
- machine tool and metrology business
- production in the aerospace, automotive and energy sector
- the research sector with challenging geometrical metrology tasks
With the forum, we would like to repeat our success of the 2013’s event with over 120 participants – however, introducing one major change: The Etalon Forum 2016 will be held in English language, thus welcoming partners and customers on an international base.
Download program and registration form!
We have compiled the following program for you:
Thursday Nov 3rd 13:00–17:30
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12:00 -13:00 Registration
13:00 Dr. H. Schwenke, Etalon GmbH:
Welcome
13:15 Dr. D. Imkamp, Zeiss IMT GmbH:
Metrology on the shop floor, where else? – Potentials and Limitations
13:45 E. Schaarschmidt, Siemens AG:
Metrology on machine tools – technical requirements and solutions
14:00 K. Kunis, Siemens AG:
Improvement of machine precision by using kinematic measurement and compensation strategies (VCS)
14:15 U. Warnatz, Fanuc Europe:
Control Technical Solutions for Typical Problems of Machine Tools
14:45 G. Günther, Heidenhain:
Methodically enhance the part accuracy with TNC controller features
15:15 Coffee break
16:00 M. Wennemer, WZL-Aachen:
A case study on a very large machine tool: Systematic deviations & thermo-elastic deformations
16:30 R.Ottone, ISONORM:
ISO 16907: Benefits and limitations of compensation of machine tool’s geometric errors
17:00 C. Hitchens, Nuclear Advanced Manufacturing Centre (NARMC):
Inspection of Large High Value Components In-Process on a Machine Tool Platform
17:30 Dr. H. Schwenke, Etalon GmbH:
Measurement, Compensation, Monitoring – Good practice and pitfalls
18:00 End
18:30 Get-Together and Dinner
Friday Nov 4th 8:30–12:00
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08:30 M. Peterek, WZL-Aachen:
Advances in Large-Scale Metrology – Technologies and Models for Cyber-Physical Systems
09:00 Dr. K. Kniel, PTB:
Tracebility for large scale metrology
09:30 Prof. A. Reichold, Oxford University
From academic research to industrial products and back: FSI technology past, present and future
10:00 Dr. H. Schwenke, Etalon GmbH
An applications driven toolbox for the Absolute Multiline Technology
10:30 Coffee break
11:00 J.-C. Gayde, CERN
Big physics and small tolerances: Metrology challenges and solutions at CERN
11:30 S. Lévêque, ESO
Metrology for the European Extremely Large Telescope
12:00 Wrap-up and Good bye
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We will kindly ask all participants for a participation fee of 95 € per person.
Download program and registration form!
We look forward to meeting you in Braunschweig!
